Technical Program

WEP-UA.3P: Measurement of Materials and Devices

Session Type: Interactive Forum
Poster Time: Wednesday, June 29, 14:40 - 16:40
Presentation Time: Wednesday, June 29, 14:40 - 15:40
Starts on Board: PD.1
Location: Poster Area D
Session Chairs: Yilong Lu, Nanyang Technological University and David Hill, National Institute of Standards and Technology
 
WEP-UA.3P.1: EFFECTIVE COMPLEX RELATIVE DIELECTRIC PROPERTIES OF COMPOSITES WITH CARBON NANOTUBES IN THE TUMBLEWEED CONFIGURATION
         Islam Afifi, Ahmed Hassan, University of Missouri–Kansas City, United States; Fernando Vargas-Lara, Jack Douglas, Edward Garboczi, NIST, United States
 
WEP-UA.3P.2: INFLUENCE OF LOW PERMITTIVITY MEDIUM CONDUCTIVITY ON RADIO FREQUENCY INDUCED POWER DEPOSITION
         Mikhail Kozlov, MR:comp GmbH, Germany; Gregor Schaefers, Magnetic Resonance Institute for Safety, Technology and Research GmbH, Germany
 
WEP-UA.3P.3: APPLICATIONS OF THE MAXIMUM ENTROPY METHOD TO ELECTROMAGNETIC COMPATIBILITY MEASUREMENTS
         David Hill, National Institute of Standards and Technology, United States
 
WEP-UA.3P.4: ATOM-BASED ELECTRIC-FIELD METROLOGY FOR MILLIMETER WAVE TO SUB-THZ FREQUENCIES
         Christopher Holloway, Matt Simons, Joshua Gordon, NIST, United States
 
WEP-UA.3P.5: FREE SPACE MATERIAL CHARACTERIZATION WITH GENETIC ALGORITHMS AND MULTIPLE OBJECTIVE COST FUNCTIONS
         Raenita Fenner, Loyola University MD, United States; Jonathan Frasch, Edward Rothwell, Michigan State University, United States
 
WEP-UA.3P.6: NEAR-FIELD HF ANTENNA PATTERN MEASUREMENT WITH ABSOLUTE GAIN CALIBRATION
         Anirudha Siripuram, Michael Daly, SPAWAR Systems Center Pacific, United States
 
WEP-UA.3P.7: CIRCULAR PATCH-RING ANTENNAS FOR V2X APPLICATIONS
         Ling Huang, Yilong Lu, Nanyang Technological University, Singapore
 

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